Abstract: This article proposes an inverse design method based on numerical Green’s function (NGF-IDM) to achieve the intelligent and efficient design of waveguide devices. Inspired by the metal ...

Abstract: Automatic Test Pattern Generation (ATPG) is a crucial technology in digital circuit testing. However, as circuit complexity increases, traditional methods face significant challenges, ...

Pattern recognition is what actually changes lives.” Instead of setting goals, Palyan suggests identifying the patterns that keep people stuck — the same relationship mistakes, career loops, and ...