No part of a product life cycle is immune to time-to-market pressures, and that includes wafer-level parametric tests on scribe-line test structures. Parallel parametric test is emerging as a ...

Santa Rosa, CA. Keysight Technologies today announced the third generation of its P9000 Series massively parallel parametric test system. The system accelerates the fast ramp of new technology and ...

The Econometrics Journal, Vol. 13, No. 3, Recent developments in structural microeconometrics (2010), pp. S1-S27 (27 pages) ...

Today’s devices are required to pass thousands of parametric tests prior to being shipped to customers. A key challenge test engineers face, in addition to optimizing the number of tests they run on ...

Advanced packaging is transforming semiconductor manufacturing into a multi-dimensional challenge, blending 2D front-end wafer fabrication with 2.5D/3D assemblies, high-frequency device ...

The use of optically-networked assemblies in defense and aerospace weapon systems is growing rapidly, and the optical test capabilities of the associated ATE is generally inadequate to provide ...